Spectrometry of x-ray fluorescence in total reflection
The spectrometry of x-ray fluorescence in total reflection , or TRXRF (total reflection X-ray fluorescence spectrometry) , is a method making it possible to analyze quantities of very small matter by Spectrométrie of x-ray fluorescence. It consists in reducing the background noise by deviating the incidental beam towards an absorber, one does not see thus any more the effect Rayleigh or Compton.
As the sample is in thin layer, there is no Effet of matrix: absorption and secondary fluorescence are negligible.
Preparation of the sample
The sample is deposited in thin layer on a carry-sample, in general in polished quartz or in polyacrylic, which behaves like a mirror of x-rays. That is done in general by depositing a quantity given of a solution to analyze. For the analysis of a solid or a filter, one can dissolve the sample, or put it in suspension in solvent. One can also put a powder or a thin section directly on the carry-sample, but then poses the problem of the quantity of matter; this “direct” method is adapted to measurement qualitative than quantitative.
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