Electron microscope with sweeping by transmission

A electron microscope with sweeping by transmission (MEBT or STEM for Scanning transmission electron microscopy ) is a type of Electron microscope whose principle of operation combines certain aspects of the Electron microscope to sweeping and of the Electron microscope in transmission. A source of electrons focuses a beam of electron S which crosses the sample. A system of magnetic lenses makes it possible this beam to sweep the surface of the sample to be analyzed.

External bonds

  • '' Transmission and Scanning Transmission Electron Microscopy ''
    • Video
  • showing certain applications of the METB on the site of the '' National Brookhaven Laboratory '' (File .ram)

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